Advanced test system, prober and tighten environment control of the Probe test service are ready to meet all your specific needs. The advanced system is capable of testing 8 inches wafers with greater throughput, focused on Memory, RF and Mixed signal devices. Our built-in engineering resources for Mixed signal testing, RF testing can provide One-Stop Turn-Key Service, including software development and hardware development. In addition, the well-controlled test process, qualified from many customers for long time can satisfy your high level quality requirements with low cost perfectly.