Probe test
Product Overview
Advanced test system, prober and tighten environment control of the Probe test service are ready to meet all your specific needs. The advanced system is capable of testing 8 inches wafers with greater throughput, focused on Memory, RF and Mixed signal devices. Our built-in engineering resources for Mixed signal testing, RF testing can provide One-Stop Turn-Key Service, including software development and hardware development. In addition, the well-controlled test process, qualified from many customers for long time can satisfy your high level quality requirements with low cost perfectly.
Available Platforms
 
 Manufacture  Model
 Teradyne  Catalyst
 LTX  LTX-CX
 Verigy  HP93K
 TSK  UF-200 Prober
 TEL  P-12 Prober
Application
  _ Digital Audio Amplifier
_ Mechatronics devices
_ ADSL modules
_ RF